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    CMI-760 The CMI-760 plating thickness meter is equipped with an eddy current probe and a magnetic induction probe, so it can be used universally according to various needs of users. Both the eddy current probe and magnetic induction probe are small, designed with a simple appearance, and are mechanically-electrically designed-manufactured with a high level of prec...

  FPCB Thickness Gauge  

Item Details X-ray tube Mo/Rh/W/Ag Target(Option), 50kVp, 1mA Detection System Si-Pin Diode (Option : SDD, FSDD) Energy Resolution Si-Pin Diode : 149eV FWHM at Mn Kα / Option : SDD(125eV), FSDD(122eV) Collimator 0.3 Collimator (Option : 0.05, 0.1, 0.2, 0.3, 1mm) Manual / Auto Changing Stage ...

Item Details X-ray tube Mo/Rh/W/Ag Target(Option), 50kVp, 1mA Detection System FSDD(Fast Silicon Draft Detector) Energy Resolution Si type Detector(FSDD) 122eV FWHM at Mn Kα Collimator Poly capillary optics(Focal Spot 15um/30um) FWHM Detection Element Ti(22)~U(92) Sample Type...

Item Details X-ray tube Mo/Rh/W/Ag Target(Option), 50kVp, 1mA Detection System Si-Pin Diode (Option : SDD, FSDD) Energy Resolution Si-Pin Diode : 149eV FWHM at Mn Kα / Option : SDD(125eV), FSDD(122eV) Collimator 0.3 Collimator (Option : 0.05, 0.1, 0.2, 0.5, 1mm) Capillary Optics 50um Ma...

Item Details X-ray tube Rh Target / Ti Target(Sulfur Analysis) Detection System Si-Pin/SDD(He Purge Option) Energy Resolution SDD : 125eV FWHM at Mn Kα Sensor areas : 30㎟ Collimator 1,3,5,8 mm Auto Change Detection Element Na(11) – U(92) – He Purge Option Samp...

  ITG-B10 It is an equipment that measures the thickness of copper on a PCB or a thin film based on the Electrical Resistance Method. It is a method of measuring by contacting Probe with the copper surface to be measured, operates based on a window operating system familiar to users, and allows more intuitive and convenient operation by applying a touch screen. ...